Discrete-time signal processing
Discrete-time signal processing
ADSP-2100 Family user's manual
ADSP-2100 Family user's manual
The scientist and engineer's guide to digital signal processing
The scientist and engineer's guide to digital signal processing
Design of self-checking fully differential circuits and boards
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Statistical Digital Signal Processing and Modeling
Statistical Digital Signal Processing and Modeling
End-to-End Test Strategy for Wireless Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Bulti-in Self-Test Strategy for Wireless Communication Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Signature Test Framework for Rapid Production Testing of RF Circuits
Proceedings of the conference on Design, automation and test in Europe
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
Low Cost Analog Testing of RF Signal Paths
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Low Cost On-Line Testing of RF Circuits
IOLTS '04 Proceedings of the International On-Line Testing Symposium, 10th IEEE
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
IEEE Communications Magazine
Reducing Test Time Using an Enhanced RF Loopback
Journal of Electronic Testing: Theory and Applications
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This work proposes the use of a simple 1-bit digitizer as an analog block observer, in order to enable the implementation of on-line test strategies for RF analog circuits in the System-on-Chip environment. The main advantages of using a simple digitizer for RF circuits are related to the increased observability of the RF signal path and minimum RF signal degradation, as neither reconfiguration of the signal path nor variable load for the analog RF circuit are introduced. As an additional advantage, the same digitizer can be used to implement BIST strategies, if required. The feasibility of using a 1-bit digitizer for the test of analog signals has already been presented in the literature for low frequency linear analog systems. This paper discusses the implementation of an on-line test strategy for analog RF circuits in the SoC environment, and presents new results for on-line RF testing. Moreover, we also provide detailed analysis regarding the overhead of the test strategy implementation. Experimental results illustrate the feasibility of the proposed technique.