Low Cost Analog Testing of RF Signal Paths
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Boundary Scan for 5-GHz RF Pins Using LC Isolation Networks
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Noise Figure Evaluation Using Low Cost BIST
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Low Cost On-Line Testing Strategy for RF Circuits
Journal of Electronic Testing: Theory and Applications
Low-cost testing of 5 GHz low noise amplifiers using new RF BIST circuit
Journal of Electronic Testing: Theory and Applications
A Novel RF Test Scheme Based on a DFT Method
Journal of Electronic Testing: Theory and Applications
Re-configuration of sub-blocks for effective application of time domain tests
Proceedings of the conference on Design, automation and test in Europe
Proceedings of the conference on Design, automation and test in Europe
Input match and load tank digital calibration of an inductively degenerated CMOS LNA
Integration, the VLSI Journal
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles
Journal of Electronic Testing: Theory and Applications
DSP-driven self-tuning of RF circuits for process-induced performance variability
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A built-in-test circuit for RF differential low noise amplifiers
IEEE Transactions on Circuits and Systems Part I: Regular Papers
A novel self-healing methodology for RF amplifier circuits based on oscillation principles
Proceedings of the Conference on Design, Automation and Test in Europe
System-level specification testing of wireless transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures
Journal of Electronic Testing: Theory and Applications
A new self-healing methodology for RF amplifier circuits based on oscillation principles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Current-reused 2.4-GHz direct-modulation transmitter with on-chip automatic tuning
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Production test costs for today's RF circuits arerapidly escalating. Two factors are responsible for thiscost escalation: (a) the high cost of RF ATEs and(b) long test times required by elaborate performancetests. In this paper, we propose a framework for low-cost signature test of RF circuits using modulation ofa baseband test signal and subsequent demodulation ofthe DUT response. The demodulated response of theDUT is used as a "signature" from which all the performance specifications are predicted. The applied testsignal is optimized in such a way that the error between the measured DUT performances and the predicted DUT performances is minimized. The proposedlow-cost solution can be easily built into a load boardthat can be interfaced to an inexpensive tester.