Microwave transistor amplifiers (2nd ed.): analysis and design
Microwave transistor amplifiers (2nd ed.): analysis and design
RF microelectronics
Analysis and Design of Analog Integrated Circuits
Analysis and Design of Analog Integrated Circuits
On the Testability of CMOS Feedback Amplifiers
Proceedings of the The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
CMOS Standard Cells Characterization for Defect Based Testing
DFT '01 Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
A Bulti-in Self-Test Strategy for Wireless Communication Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Signature Test Framework for Rapid Production Testing of RF Circuits
Proceedings of the conference on Design, automation and test in Europe
BiST Model for IC RF-Transceiver Front-End
DFT '03 Proceedings of the 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
A New BIST Scheme for 5GHz Low Noise Amplifiers
ETS '04 Proceedings of the European Test Symposium, Ninth IEEE
On-Chip Testing Techniques for RF Wireless Transceivers
IEEE Design & Test
Evaluation of analog/RF test measurements at the design stage
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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This paper presents a new low-cost RF BIST (Built-In Self-Test) scheme that is capable of measuring input impedance, gain, noise figure and input return loss for a low noise amplifier (LNA) in RF systems. The RF BIST technique requires an additional RF amplifier and two peak detectors, and its output is a DC voltage level. The BIST circuit is designed using 0.18 µm SiGe technology. The test technique utilizes output DC voltage measurements and these measured values are translated into the LNA specifications such as input impedance and gain using the developed mathematical equations. Simulation results are presented for an LNA working at 5 GHz. Measurement data are compared with simulation results to validate the developed mathematical equations. The technique is simple and inexpensive.