CMOS Standard Cells Characterization for Defect Based Testing

• Authors:

• Witold A. Pleskacz;Dominik Kasprowicz;Tomasz Oleszczak;Wieslaw Kuzmicz

• Affiliations:

• -;-;-;-

• Venue:
• DFT '01 Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
• Year:
• 2001