A New BIST Scheme for 5GHz Low Noise Amplifiers

Authors:
Jee-Youl Ryu;Bruce C. Kim;Iboun Sylla
Affiliations:
Arizona State University, Tempe, AZ;Arizona State University, Tempe, AZ;Texas Instruments, Inc., Dallas, Texas
Venue:
ETS '04 Proceedings of the European Test Symposium, Ninth IEEE
Year:
2004

Citing 0
Cited 2

Low-cost testing of 5 GHz low noise amplifiers using new RF BIST circuit

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A Novel RF Test Scheme Based on a DFT Method

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Abstract

This paper presents a new low-cost Built-In Self-Test (BIST) circuit for measuring gain, noise figure and input impedance of 5GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18 µm SiGe technology. The test technique utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive.