End-to-End Test Strategy for Wireless Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Architecting Millisecond Test Solutions for Wireless Phone RFIC's
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Journal of Electronic Testing: Theory and Applications
A CMOS RF RMS Detector for Built-in Testing of Wireless Transceivers
VTS '05 Proceedings of the 23rd IEEE Symposium on VLSI Test
Use of Embedded Sensors for Built-In-Test of RF Circuits
ITC '04 Proceedings of the International Test Conference on International Test Conference
Low-cost testing of 5 GHz low noise amplifiers using new RF BIST circuit
Journal of Electronic Testing: Theory and Applications
A general method to evaluate RF BIST techniques based on non-parametric density estimation
Proceedings of the conference on Design, automation and test in Europe
Estimation of RF PA Nonlinearities after Cross-correlating Current and Output Voltage
Journal of Electronic Testing: Theory and Applications
Detailed characterization of transceiver parameters through loop-back-based BiST
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Built-in loopback test for IC RF transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures
Journal of Electronic Testing: Theory and Applications
Current-reused 2.4-GHz direct-modulation transmitter with on-chip automatic tuning
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Testing RF circuits with true non-intrusive built-in sensors
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
Advances in variation-aware modeling, verification, and testing of analog ICs
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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This article describes a set of on-chip testing techniques and their application to integrated wireless RF transceivers. The objective is to reduce final product cost and accelerate time to market by providing means of testing the entire transceiver system as well as its major building blocks without using off-chip analog or RF instrumentation. On-chip test devices fabricated in a standard CMOS process and experimentally evaluated support the proposed test strategy.