RF microelectronics
Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
A Signature Test Framework for Rapid Production Testing of RF Circuits
Proceedings of the conference on Design, automation and test in Europe
System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Journal of Electronic Testing: Theory and Applications
Robust Built-In Test of RF ICs Using Envelope Detectors
ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
On-Chip Testing Techniques for RF Wireless Transceivers
IEEE Design & Test
A DFT Approach for Testing Embedded Systems Using DC Sensors
IEEE Design & Test
Broadband RF stage architecture for software-defined radio in handheld terminal applications
IEEE Communications Magazine
Software-defined radio receiver: dream to reality
IEEE Communications Magazine
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Built-In RF test is a challenging problem due to the need to measure the values of complex test specifications on-chip with the precision of external RF test equipment. BIT techniques are necessary for guiding system adaptation during field operation. Prior research has demonstrated that embedded RF sensors can generate significant information about RF circuit performance. In this paper, we propose a test methodology that enables efficient BIT and BIT-enabled tuning of RF systems. A test generation approach is developed that co-optimizes the applied test stimulus, the type of embedded sensors, and the system response capture mechanisms for maximal accuracy of the BIT procedure. This BIT technique is also used to perform diagnostic testing of the transmitter. The information gathered from diagnosis is used to tune the transmitter for improved performance. Simulation results demonstrate that BIT-assisted diagnosis and tuning can be performed with good accuracy using the proposed methodology.