Discrete-time signal processing
Discrete-time signal processing
RF microelectronics
End-to-End Test Strategy for Wireless Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
A Bulti-in Self-Test Strategy for Wireless Communication Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Testability implications in low-cost integrated radio transceivers: a Bluetooth case study
Proceedings of the IEEE International Test Conference 2001
7.2 Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Test Generation for Accurate Prediction of Analog Specifications
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Numerical Methods for Unconstrained Optimization and Nonlinear Equations (Classics in Applied Mathematics, 16)
On-Chip Testing Techniques for RF Wireless Transceivers
IEEE Design & Test
Defect-based test optimization for analog/RF circuits for near-zero DPPM applications
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
System-level specification testing of wireless transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
BIST/Digital-Compatible Testing of RF Devices Using Distortion Model Fitting
Journal of Electronic Testing: Theory and Applications
Low Cost Time Efficient Multi-tone Test Signal Generation Using OFDM Technique
Journal of Electronic Testing: Theory and Applications
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In the recent past, with the emergence of System-on-Chip (SoC), focus has shifted towards testing system specifications rather than device or module specifications. While the problem of test accessibility for test stimulus application and response capture for such high-speed systems remains a challenge to the test engineers, new test strategies are needed which can address the problem in a practical manner. In this paper, the problem of testing the transmitter and the receiver subsystems of a RF transceiver for system level specification is addressed. Instead of using different conventional test stimuli for testing each of the system level specifications of RF subsystems, a specially crafted test stimulus is used for testing all the specifications from the response of the subsystem-under-test. A new simulation approach has also been developed to perform fast behavioral simulations in frequency domain for the system-under-test. In the test method, frequency domain test response spectra are captured and non-linear regression models are constructed to map the spectral measurements onto the specifications of interest. In the presented simulation results, the test stimuli have been validated using netlist level simulation of the subsystem-under-test and specifications have been predicted within an error of 卤3% of the actual value.