Cutting the high cost of testing
IEEE Spectrum
Optimal ordering of analog integrated circuit tests to minimize test time
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Analytical fault modeling and static test generation for analog ICs
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Design based analog testing by Characteristic Observation Inference
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Multifrequency Analysis of Faults in Analog Circuits
IEEE Design & Test
Analog Testing with Time Response Parameters
IEEE Design & Test
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits
Proceedings of the IEEE International Test Conference on Test and Design Validity
Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs
Proceedings of the IEEE International Test Conference on Test and Design Validity
Fault Macromodeling for Analog/Mixed-Signal Circuits
Proceedings of the IEEE International Test Conference
An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Test Vector Generation for Linear Analog Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
A novel test generation approach for parametric faults in linear analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Implicit functional testing for analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
CLP-based Multifrequency Test Generation for Analog Circuits
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
On Maximizing the Coverage of Catastrophic and Parametric Faults
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Verification of delta-sigma converters using adaptive regression modeling
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
ARVLSI '99 Proceedings of the 20th Anniversary Conference on Advanced Research in VLSI
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Prediction of Analog Performance Parameters Using Oscillation Based Test
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Journal of Electronic Testing: Theory and Applications
Optimized wafer-probe and assembled package test design for analog circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Verifying functional specifications by regression techniques on Lissajous test signatures
IEEE Transactions on Circuits and Systems Part I: Regular Papers
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources
Journal of Electronic Testing: Theory and Applications
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The use of alternate tests in addition to specification-based measurements is achieving more recognition in industry due to the higher coverage that they provide. The fault and yield coverages of these tests depend on how the pass/fail test decision is made. In this paper, we address the critical issue of accurate test threshold determination for these alternate tests. We propose to post-process the given set of sensitive and linearly independent measurements to synthesize a new set of measurements based on which the pass/fail decision is made. A novel methodology for post processing the measurement results called measurement synthesis is presented. Simulation results show that test effectiveness can be greatly enhanced by measurement synthesis.