ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Test generation based diagnosis of device parameters for analog circuits
Proceedings of the conference on Design, automation and test in Europe
Fault detection for linear analog circuits using current injection
Proceedings of the conference on Design, automation and test in Europe
Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Fault Diagnosis for Linear Analog Circuits
Journal of Electronic Testing: Theory and Applications
7.2 Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Optimized wafer-probe and assembled package test design for analog circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Test Generation Algorithm for Linear Systems Based on Genetic Algorithm
Journal of Electronic Testing: Theory and Applications
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While analog test generation tools are still in their infancy, the corresponding tools in the digital domain have reached a fair degree of maturity and acceptance. Recognizing this fact, we propose a novel test generation method for linear analog circuits that employs well established digital test software to generate time-domain tests for analog parametric faults. We transform the analog circuit to an equivalent digital circuit, and target only those stuck-at faults in the digital circuit that could possibly capture parametric failures in the original analog circuit. Hence, the sequence of digital test vectors obtained from any test generator represents a test waveform for the analog parametric faults. The technique is illustrated using examples that show this to be a simple, yet attractive alternative to costlier simulation-based analog test generation approaches.