Fundamentals of matrix computations
Fundamentals of matrix computations
Dynamic test signal design for analog ICs
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Minimal length diagnostic tests for analog circuits using test history
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Parametric fault diagnosis for analog systems using functional mapping
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Genetic Algorithms in Search, Optimization and Machine Learning
Genetic Algorithms in Search, Optimization and Machine Learning
Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Specification-Driven Test Design for Analog Circuits
DFT '98 Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems
Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs
Proceedings of the IEEE International Test Conference on Test and Design Validity
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
A novel test generation approach for parametric faults in linear analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Hierarchical Test Generation for Analog Circuits Using Incremental Test Development
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Generation for Accurate Prediction of Analog Specifications
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Parameter extraction for statistical IC modeling based on recursive inverse approximation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Analog testing by characteristic observation inference
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Polynomial coefficient based DC testing of non-linear analog circuits
Proceedings of the 19th ACM Great Lakes symposium on VLSI
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Test Generation Algorithm for Linear Systems Based on Genetic Algorithm
Journal of Electronic Testing: Theory and Applications
Fault diagnosis of analog circuits based on machine learning
Proceedings of the Conference on Design, Automation and Test in Europe
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme
Journal of Electronic Testing: Theory and Applications
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