Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme

Authors:
Sukeshwar Kannan;Bruce Kim;Ganesh Srinivasan;Friedrich Taenzlar;Richard Antley;Craig Force
Affiliations:
University of Alabama, Tuscaloosa, USA;University of Alabama, Tuscaloosa, USA;Texas Instruments Inc., Dallas, USA;Texas Instruments Inc., Dallas, USA;Texas Instruments Inc., Dallas, USA;Texas Instruments Inc., Dallas, USA
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2011

Citing 4
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Abstract

This paper provides development of an RF circuit software tool that automatically generates diagnostic programs for device interface boards. The diagnostic tool utilizes novel techniques to differentiate faulty RF circuits embedded in printed circuit boards. We present RF circuit diagnostic techniques using power sensors and multi-tone dither testing, which we integrated into the diagnostic software tool that we developed. The diagnostic tool provides user-transparent pseudocodes with high fault coverage and significantly decreases time to market.