Test generation based diagnosis of device parameters for analog circuits
Proceedings of the conference on Design, automation and test in Europe
A parametric test method for analog components in integrated mixed-signal circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Structural Fault Based Specification Reduction for Testing Analog Circuits
Journal of Electronic Testing: Theory and Applications
Generating decision regions in analog measurement spaces
GLSVLSI '05 Proceedings of the 15th ACM Great Lakes symposium on VLSI
Polynomial coefficient based DC testing of non-linear analog circuits
Proceedings of the 19th ACM Great Lakes symposium on VLSI
A low-cost configurability test strategy for an embedded analog circuit
Microelectronics Journal
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This paper presents a new approach to the test design of analog circuits, called characteristic observation inference (COI). The COI method considers parametric as well as catastrophic faults. A strict distinction between the operational environment, defined by the specifications of the circuit, and the test environment, defined by the test configuration and the test equipment, is introduced. A parametric fault model is developed that combines circuit specifications, statistical parameters reflecting parametric faults, and measurements of the circuit under test. These measurements are called characteristic observations. For each specification, a test inference criterion is computed using feature extraction and logistic discrimination analysis. From a set of such criteria the satisfaction or violation of the specifications can be inferred from characteristic observations. Based on these results, additional test criteria for catastrophic faults are determined using test set compaction. Moreover, measurement noise and parasitic effects, which crucially influence the test design, are systematically considered, and a physically interpretable sampling strategy is presented. The COI method applied to two different test designs yields very good results with respect to parametric faults as well as to catastrophic faults