Fault-based automatic test generator for linear analog circuits
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Test Vector Generation for Linear Analog Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Efficient analog test methodology based on adaptive algorithms
DAC '98 Proceedings of the 35th annual Design Automation Conference
A method to diagnose faults in linear analog circuits using an adaptive tester
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Minimal length diagnostic tests for analog circuits using test history
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Robust optimization based backtrace method for analog circuits
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Proceedings of the conference on Design, automation and test in Europe
Analog Integrated Circuits and Signal Processing
Journal of Electronic Testing: Theory and Applications
Structural Fault Based Specification Reduction for Testing Analog Circuits
Journal of Electronic Testing: Theory and Applications
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
7.2 Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
Symbolic Techniques for the Selection of Test Frequencies in Analog Fault Diagnosis
Analog Integrated Circuits and Signal Processing
A 0.8 μm CMOS switched-capacitor video filter
SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design
Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST
SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design
Efficient Parametric Fault Detection in Switched-Capacitor Filters
IEEE Design & Test
Efficient symbolic sensitivity analysis of analog circuits using element-coefficient diagrams
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
A 0.8 µm CMOS testable switched-capacitor filter for video frequency applications
Analog Integrated Circuits and Signal Processing
Re-configuration of sub-blocks for effective application of time domain tests
Proceedings of the conference on Design, automation and test in Europe
A built-in-test circuit for RF differential low noise amplifiers
IEEE Transactions on Circuits and Systems Part I: Regular Papers
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The deviation of defective components in analog circuits can be modeled in a continuous form. These deviations can be soft, large deviation, or hard faults. Observing these three kinds of faults for the same component is different from one kind of fault to another. Testability analysis in analog circuits in the presence of these three kinds of faults is an important task and a desirable approach for producing testable systems. The purpose of this article is to analyze these faults by observing their various symptoms at the output. The proposed approach offers the possibility of analyzing both soft and hard faults using the same test methodology. We study the testability of analog circuits in the frequency domain in the presence of these faults using the analog fault observability concept. The proposed algorithm indicates the set of adequate test frequencies and test nodes that increase fault observability. We then generate the test vectors that allow us to observe all these kinds of faults and to cover them. Some simulation and experimental results are provided to show the importance of the appropriate fault modeling technique and analysis.