Discrete-time signal processing
Discrete-time signal processing
ABILBO: Analog BuILt-in Block Observer
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Multifrequency Analysis of Faults in Analog Circuits
IEEE Design & Test
A Bulti-in Self-Test Strategy for Wireless Communication Systems
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Proceedings of the 40th annual Design Automation Conference
Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores
ITC '02 Proceedings of the 2002 IEEE International Test Conference
A Set of Benchmarks fo Modular Testing of SOCs
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Test Planning and Design Space Exploration in a Core-Based Environment
Proceedings of the conference on Design, automation and test in Europe
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
Effective Oscillation-Based Test for application to a DTMF Filter Bank
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Low Cost Analog Testing of RF Signal Paths
Proceedings of the conference on Design, automation and test in Europe - Volume 1
TAM Optimization for Mixed-Signal SOCs using Analog Test Wrappers
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
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Analog BIST and SoC testing are two topics that have been extensively, but independently, studied in the last few years. However, current mixed-signals systems require the combination of these subjects to generate a cost-effective test solution for the whole SoC. This paper discusses the impact on the global system testing time of an analog BIST method based on digital reuse. Experimental results show that the reuse of digital blocks to test analog signals is indeed a very efficient strategy, even under power constraints, as long as the BIST technique reduces the analog testing time.