A Statistical Sampler for a New On-Line Analog Test Method

Authors:
Marcelo Negreiros;Luigi Carro;Altamiro A. Susin
Affiliations:
Instituto de Informática-PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, Brasil. negreiro@inf.ufrgs.br;Instituto de Informática-PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, Brasil. carro@inf.ufrgs.br;Instituto de Informática-PPGC, Universidade Federal do Rio Grande do Sul, Porto Alegre, RS, Brasil. susin@inf.ufrgs.br
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2003

Citing 10
Cited 10

Discrete-time signal processing

Discrete-time signal processing
ABILBO: Analog BuILt-in Block Observer

Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Statistical Digital Signal Processing and Modeling

Statistical Digital Signal Processing and Modeling
Random Data: Analysis and Measurement Procedures

Random Data: Analysis and Measurement Procedures
Multifrequency Analysis of Faults in Analog Circuits

IEEE Design & Test
Analog and Mixed-Signal Benchmark Circuits-First Release

Proceedings of the IEEE International Test Conference
Evaluation of iDD/vOUT Cross-Correlation for Mixed Current/Voltage Testing of Analogue and Mixed-Signal Circuits

EDTC '96 Proceedings of the 1996 European conference on Design and Test
A STAND-ALONE INTEGRATED TEST CORE FOR TIME AND FREQUENCY DOMAIN MEASUREMENTS

ITC '00 Proceedings of the 2000 IEEE International Test Conference
A solution for the on-line test of analog ladder filters

VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Effective Oscillation-Based Test for application to a DTMF Filter Bank

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Low Cost Analog Testing of RF Signal Paths

Proceedings of the conference on Design, automation and test in Europe - Volume 1
Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST

SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design
Noise Figure Evaluation Using Low Cost BIST

Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
An On-Chip Spectrum Analyzer for Analog Built-In Testing

Journal of Electronic Testing: Theory and Applications
Sine-Wave Signal Characterization Using Square-Wave and ΣΔ-Modulation: Application to Mixed-Signal BIST

Journal of Electronic Testing: Theory and Applications
Low Cost On-Line Testing Strategy for RF Circuits

Journal of Electronic Testing: Theory and Applications
An improved RF loopback for test time reduction

Proceedings of the conference on Design, automation and test in Europe: Proceedings
Reducing Test Time Using an Enhanced RF Loopback

Journal of Electronic Testing: Theory and Applications
Practical implementation of a network analyzer for analog BIST applications

Proceedings of the conference on Design, automation and test in Europe
Design of a window comparator with adaptive error threshold for online testing applications

Microelectronics Journal

Quantified Score

Hi-index	0.00

Visualization

Abstract

The use of very deep submicron technology makes VLSI-based digital systems more susceptible to transient or soft errors, and thus compromises their reliability. This paper proposes an architecture inspired by the human immune system that allows tolerance ...