Digital Methods for Signal Analysis
Digital Methods for Signal Analysis
Progress in Design for Test: A Personal View
IEEE Design & Test
Design for Testability of a Modular, Mixed Signal Family of VLSI Devices
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Defect-oriented test methodology for complex mixed-signal circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
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The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current/voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and built-in self test techniques.