Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components
EDTC '96 Proceedings of the 1996 European conference on Design and Test
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
A 0.8 μm CMOS switched-capacitor video filter
SBCCI '04 Proceedings of the 17th symposium on Integrated circuits and system design
Design of concurrent test hardware for linear analog circuits with constrained hardware overhead
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A 0.8 µm CMOS testable switched-capacitor filter for video frequency applications
Analog Integrated Circuits and Signal Processing
Design of a window comparator with adaptive error threshold for online testing applications
Microelectronics Journal
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Abstract: In this paper we study stability problems associated with the previously developed design for test (DFT) methodology applied to ladder filters. A solution based on simple modification of the basic DFT strategy is proposed which allows on-line testing of ladder filters. A filter example demonstrates the feasibility of the solution.