Noise Figure Evaluation Using Low Cost BIST

Authors:
Marcelo Negreiros;Luigi Carro;Altamiro A. Susin
Affiliations:
Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, RS, Brazil;Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, RS, Brazil;Universidade Federal do Rio Grande do Sul - UFRGS, Porto Alegre, RS, Brazil
Venue:
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Year:
2005

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Abstract

A technique for evaluating noise figure suitable for BIST implementation is described. It is based on a low cost single-bit digitizer, which allows the simultaneous evaluation of noise figure in several test points of the analog circuit. The method is also able to benefit from SoC resources, like memory and processing power. Theoretical background and experimental results are presented in order to demonstrate the feasibility of the approach.