DSP-Based Testing of Analog and Mixed-Signal Circuits
DSP-Based Testing of Analog and Mixed-Signal Circuits
On-Chip Evaluation of Oscillation-Based-Test Output Signals for Switched-Capacitor Circuits
Analog Integrated Circuits and Signal Processing
Practical Oscillation-Based Test of Integrated Filters
IEEE Design & Test
A Statistical Sampler for a New On-Line Analog Test Method
Journal of Electronic Testing: Theory and Applications
A 0.18 µm CMOS Implementation of On-chip Analogue Test Signal Generation from Digital Test Patterns
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Testing analog and mixed-signal integrated circuits using oscillation-test method
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Practical implementation of a network analyzer for analog BIST applications
Proceedings of the conference on Design, automation and test in Europe
A BIST Solution for Frequency Domain Characterization of Analog Circuits
Journal of Electronic Testing: Theory and Applications
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures
Journal of Electronic Testing: Theory and Applications
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This paper presents a method for extracting, in the digital domain, the main characteristic parameters of an analog sine-wave signal. It is based on a double-modulation, square-wave and sigma-delta, together with a simple Digital Processing Algorithm. It leads to an efficient and robust approach very suitable for BIST applications. In this line, some considerations for on-chip implementation are addressed together with simulation results that validate the feasibility of the proposed approach.