Design based analog testing by Characteristic Observation Inference
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Dynamic test signal design for analog ICs
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Minimal length diagnostic tests for analog circuits using test history
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Scientific Computing and Differential Equations: An Introduction to Numerical Methods
Scientific Computing and Differential Equations: An Introduction to Numerical Methods
Multifrequency Analysis of Faults in Analog Circuits
IEEE Design & Test
Analog Testing with Time Response Parameters
IEEE Design & Test
LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits
Proceedings of the IEEE International Test Conference on Test and Design Validity
Test Vector Generation for Linear Analog Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Test generation for mixed-signal devices using signal flow graphs
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
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In this paper, we propose a new robust approach to signal backtrace for efficiently testing embedded analog modules in a large system. The proposed signal backtrace method is formulated as a solution to a multi-point boundary value problem (BVP), with constraints on the output state and the input. This error constraint minimizes large spurious deviations in the input signal and the corvergence problems that arise if multiple solutions exist or if the desired signal does not exist in the feasible signal space. As an additional attractive advantage, this formulation preserves the core iteration structure of a SPICE-like simulator without modifications, greatly easing implementation.