Efficient symbolic sensitivity analysis of analog circuits using element-coefficient diagrams

Authors:
Huiying Yang;Mukesh Ranjan;Wim Verhaegen;Mengmeng Ding;Ranga Vemuri;Geoges Gielen
Affiliations:
University of Cincinnati, OH;University of Cincinnati, OH;Katholieke University Leuven, Leuven, Belgium;University of Cincinnati, OH;University of Cincinnati, OH;Katholieke University Leuven, Leuven, Belgium
Venue:
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Year:
2005

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Abstract

This paper presents a new method to perform efficient first-order symbolic sensitivity analysis of analog circuits by direct differentiation of symbolic expressions stored as element-coefficient diagrams (ECDs). An ECD is a compact graphical representation of a symbolic transfer function. It is the cancellation-free and per-coefficient term generation version of determinant decision diagrams (DDDs). The symbolic sensitivity equations obtained from ECDs are stored as a sensitivity-ECDs(SECDs) and can be evaluated extremely fast as it inherits the properties of ECDs. The proposed methodology has been applied to the calculation of sensitivities of four benchmark circuits and it has been demonstrated to be as accurate and more efficient than numerical sensitivity analysis done by SPECTRE.