Multiple fault analog circuit testing by sensitivity analysis
Journal of Electronic Testing: Theory and Applications - Joint special issue on analog and mixed-signal testing
Dynamic test signal design for analog ICs
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Minimal length diagnostic tests for analog circuits using test history
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Multifrequency Analysis of Faults in Analog Circuits
IEEE Design & Test
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
An Integrated Approach for Analog Ciruit Testing with a Minmum Number of Detected Parameters
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Test Vector Generation for Linear Analog Devices
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Implicit functional testing for analog circuits
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
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