Proceedings of the conference on Design, automation and test in Europe
Random Data: Analysis and Measurement Procedures
Random Data: Analysis and Measurement Procedures
Proceedings of the 40th annual Design Automation Conference
Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits
ATS '01 Proceedings of the 10th Asian Test Symposium
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
An On-Chip Spectrum Analyzer for Analog Built-In Testing
Journal of Electronic Testing: Theory and Applications
De-noising by soft-thresholding
IEEE Transactions on Information Theory
Testing analog and mixed-signal integrated circuits using oscillation-test method
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Prediction of analog performance parameters using fast transient testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A DFT Approach for Testing Embedded Systems Using DC Sensors
IEEE Design & Test
Electrical characterization of analogue and RF integrated circuits by thermal measurements
Microelectronics Journal
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
System-level specification testing of wireless transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model
Journal of Electronic Testing: Theory and Applications
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This paper addresses the cost, signal integrity and I/Obandwidth problems in radio-frequency testing by proposing afeature extraction based built-in alternate test scheme. Thescheme is suitable for built-in self-test of radio-frequencycomponents embedded in a system with available digital signalprocessing resources, and can also be extended to implementbuilt-in test solutions for individual RF devices that have accessto a low-end digital tester. The process applies an alternate testand automatically extracts features from the component responseto predict specifications like third order intercept point, 1dBcompression point, noise figure, gain and power supply rejectionratio. The proposed scheme makes use of low-speed low-resolutionundersampling to eliminate the need for a bulkyanalog-to-digital converter and the use of a noise reference forcomparison makes it possible to compensate for imperfectstimulus generation. The simulation results for a 1 GHzdownconversion mixer and a 900 MHz low-noise amplifierpresent an average of 97.3% prediction accuracy of specificationsunder test.