Testability implications in low-cost integrated radio transceivers: a Bluetooth case study

Authors:
Christian Olgaard;Sule Ozev;Alex Orailoglu
Affiliations:
-;-;-
Venue:
Proceedings of the IEEE International Test Conference 2001
Year:
2001

Citing 0
Cited 4

GHz RF Front-end Bandwidth Time Domain Measurement

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications

Journal of Electronic Testing: Theory and Applications
Go/No-Go testing of VCO modulation RF transceivers through the delayed-RF setup

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
System-level specification testing of wireless transceivers

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Quantified Score

Hi-index	0.00

Visualization

Abstract