System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams

Authors:
Soumendu Bhattacharya;Ganesh Srinivasan;Sasikumar Cherubal;Achintya Halder;Abhijit Chatterjee
Affiliations:
-;-;-;-;-
Venue:
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Year:
2004

Citing 2
Cited 3

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Abstract

In this paper, a novel algorithm has been proposed tomeasure system specifications of an integratedtransmitter, which capture the non-linearities of thesystem-under-test. The measurement of thesespecifications is important, as these determine the amountof "interference" created by the transmitting system inadjacent channels while transmitting data in a specificchannel. By using an optimized periodic bitstream, withenergy concentrated at fewer frequencies, all thespecifications of interest are measured. This requiresfewer measurements and hence, significantly reduced testtime compared to standard test techniques. Studies showthat the test time can be reduced considerably bychanging the number of periods of the optimum bit-sequencewithout losing accuracy in measurement. Thenumber of test measurements was reduced by a factor oftwo. Overall, using the proposed approach, more than anorder of magnitude reduction in test time was achieved,while the different specifications were measured up to amaximum accuracy of 卤0.2% of the actual value.