Input match and load tank digital calibration of an inductively degenerated CMOS LNA

Authors:
James Wilson;Mohammed Ismail
Affiliations:
Analog VLSI Lab, The Ohio State University, Columbus, OH 43210, USA;Analog VLSI Lab, The Ohio State University, Columbus, OH 43210, USA
Venue:
Integration, the VLSI Journal
Year:
2009

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Abstract

This paper presents a technique for independently tuning the center frequency and quality of the input match for a CMOS low noise amplifier implemented using the inductive source degenerating topology. This technique allows for the input match to be centered to the desired frequency in the presence of process shifts and parasitic elements. The complete calibration loop is presented. The implemented calibration circuits allow for fast calibration, low additional power consumption during calibration, and negligible additional power consumption during operation. In addition, the center frequency of the load tank is tuned to match the desired center frequency of operation using the same calibration loop.