Optimising Test Sets for a Low Noise Amplifier with a Defect-Oriented Approach

Authors:
R. Kheriji;V. Danelon;J. L. Carbonero;S. Mir
Affiliations:
ST Microelectronics, France/ TIMA laboratory, France;ST Microelectronics, France;ST Microelectronics, France;TIMA laboratory, France
Venue:
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Year:
2005

Citing 1
Cited 2

A Signature Test Framework for Rapid Production Testing of RF Circuits

Proceedings of the conference on Design, automation and test in Europe

Interactive presentation: Evaluation of test measures for LNA production testing using a multinormal statistical model

Proceedings of the conference on Design, automation and test in Europe
A Robust 130 nm-CMOS Built-In Current Sensor Dedicated to RF Applications

Journal of Electronic Testing: Theory and Applications

Quantified Score

Hi-index	0.00

Visualization

Abstract

This paper is aimed at studying defect-oriented test techniques for RF components in order to optimize production test sets. This study is mandatory for the definition of an efficient test flow strategy. We have carried out a fault simulation campaign for a Low-Noise Amplifier (LNA) for reducing a test set while maintaining high fault coverage. The set of production test measurements should include low-cost structural tests such as simple current consumption and only a few more sophisticated tests dedicated to functional specifications such as S parameters, Noise Figure (NF) or IP3.