Analysis and Design of Analog Integrated Circuits
Analysis and Design of Analog Integrated Circuits
Design for Variability in DSM Technologies
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
A Signature Test Framework for Rapid Production Testing of RF Circuits
Proceedings of the conference on Design, automation and test in Europe
Parallel Loopback Test of Mixed-Signal Circuits
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
System-level specification testing of wireless transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A low-cost test solution for wireless phone RFICs
IEEE Communications Magazine
Prediction of analog performance parameters using fast transient testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Low-Cost Specification Based Testing of RF Amplifier Circuits using Oscillation Principles
Journal of Electronic Testing: Theory and Applications
Iterative built-in testing and tuning of mixed-signal/RF systems
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
A novel self-healing methodology for RF amplifier circuits based on oscillation principles
Proceedings of the Conference on Design, Automation and Test in Europe
A test and calibration strategy for adjustable RF circuits
Analog Integrated Circuits and Signal Processing
A new self-healing methodology for RF amplifier circuits based on oscillation principles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Proceedings of the International Conference on Computer-Aided Design
Input impedance matching optimization for adaptive low-power low-noise amplifiers
Analog Integrated Circuits and Signal Processing
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In the deep-submicrometer design regime, RF circuits are expected to be increasingly susceptible to process variations, and thereby suffer from significant loss of parametric yield. To address this problem, a postmanufacture self-tuning technique that aims to compensate for multiparameter variations is presented. The proposed method incorporates a "response feature" detector and "hardware tuning knobs," designed into the RF circuit. The RF device test response to a specially crafted diagnostic test stimulus is logged via the built-in detector and embedded analog-to-digital converter. Analysis and prediction of the optimal tuning knob control values for performance compensation is performed using software running on the baseband DSP processor. As a result, the RF circuit performance can be diagnosed and tuned with minimal assistance from external test equipment. Multiple RF performance parameters can be adjusted simultaneously under tuning knob control. The proposed concepts are illustrated for an RF low-noise amplifier (LNA) design and can be applied to other RF circuits as well. A simulation case study and hardware measurements on a fabricated 1.9-GHz LNAs show significant parametric yield enhancement (up to 58%) across the critical RF performance specifications of interest.