Boundary Scan for 5-GHz RF Pins Using LC Isolation Networks

Authors:
Tian-Wei Huang;Pei-Si Wu;Ren-Chieh Liu;Jeng-Han Tsai;Huei Wang;Tzi-Dar Chiueh
Affiliations:
-;-;-;-;-;-
Venue:
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Year:
2004

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Abstract

The boundary-scan test provides a structural testsolution for the densely packed digital electronics. For RFdevices, the structural test also provides a gooddiagnostic resolution to the structural defects of RFcircuits, especially for the high pin-count RF-SOCs. Inthis paper, the boundary-scan test is implemented on a 5-GHz RF pin using LC isolation networks to connect the RF lines and the boundary-scan cell, which isolates theRF circuitry from the digital boundary scan cell. Thistechnique overcomes the parasitic loading problems andprovides a minimum RF performance degradation to aRFIC. The measurement results show only 0.4-dB gaindegradation in a 5-GHz amplifier with a boundary-scancell and LC isolation networks.