Low Cost On-Line Testing of RF Circuits

  • Authors:

  • Marcelo Negreiros;Luigi Carro;Altamiro A. Susin

  • Affiliations:

  • Universidade Federal do Rio Grande do Sul, Brazil;Universidade Federal do Rio Grande do Sul, Brazil;Universidade Federal do Rio Grande do Sul, Brazil

  • Venue:
  • IOLTS '04 Proceedings of the International On-Line Testing Symposium, 10th IEEE
  • Year:
  • 2004

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Abstract

In this work we extend previous work on the test ofanalog circuits in order to enable on-line testing of RFcircuits. The application of a simple and low cost digitizer(statistical sampler) enables the observation of analogtest points in RF circuits. The single bit digital output ofthe converter is used in order to perform spectral analysisof the RF signals. As the technique does not requirereconfiguration of the signal path, neither signal-pathdegradation nor variable load for the analog circuit isintroduced. Furthermore, the same digitizer hardwarecan be used in order to implement BIST strategies. Thepaper discusses the application of the statistical samplerto a basic RF signal path in order to implement on-linetest strategies. Experimental results are provided in orderto illustrate the feasibility of the approach.