Digital communications
Wafer-level RF Test and DfT for VCO Modulating Transceiver Architecures
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
RF-BIST: Loopback Spectral Signature Analysis
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Mixed Loopback BiST for RF Digital Transceivers
DFT '04 Proceedings of the Defect and Fault Tolerance in VLSI Systems, 19th IEEE International Symposium
Low-cost Production Test of BER for Wireless Receivers
ATS '05 Proceedings of the 14th Asian Test Symposium on Asian Test Symposium
Advanced methods for I/Q imbalance compensation in communicationreceivers
IEEE Transactions on Signal Processing
IEEE Communications Magazine
Built-in loopback test for IC RF transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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The paper presents a new technique of symbol error rate test (SER) for RF transceivers. A simple DSP algorithm implemented at the receiver baseband is introduced in terms of constellation correction, which is usually used to compensate for IQ imbalance. The test is oriented at detection of impairments in gain and noise figure in a transceiver frontend. The proposed approach is shown to enhance the sensitivity of a traditional SER test to the limits of its counterpart, the error vector magnitude (EVM) test. Its advantage over EVM is in simple implementation, lower DSP overhead and the ability of achieving a larger dynamic range of the test response. Also the test time is saved compared to a traditional SER test. The technique is validated by a simulation model of a Wi-Fi transceiver implemented in Matlab™.