Interactive presentation: Boosting SER test for RF transceivers by simple DSP technique
Proceedings of the conference on Design, automation and test in Europe
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Built-in loopback test for IC RF transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
RF on-chip test by reconfiguration technique
ICC'06 Proceedings of the 10th WSEAS international conference on Circuits
System-level specification testing of wireless transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Bit error rate (BER) is a key specification that characterizes the performance of a communication receiver. In digital radio applications, running BER tests during production is highly prohibitive in terms of test cost due to the prolonged testing time required for applying RF modulated digital data-frames (each containing pseudo-random bit patterns) to the receiver and capturing the response digital bits at low baseband data-rate. Accurate and repeatable BER measurement requires the use of a large number of data-frames. In this paper, a new production testing methodology for measuring BER of wireless receivers is presented. The proposed methodology significantly reduces the time for making BER measurements by applying a sequence of AC tests. The BER value is predicted using statistical regression models that map the results of the AC tests to the expected BER value. The method also alleviates the need for using a complex BER tester (BERT). Experimental results for a 900 MHz wireless receiver are presented.