Metrics, techniques and recent developments in mixed-signal testing
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
SWITTEST: automatic switch-level fault simulation and test evaluation of switched-capacitor systems
DAC '97 Proceedings of the 34th annual Design Automation Conference
Fault Simulation for Analog Circuits Under Parameter Variations
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Efficient DC fault simulation of nonlinear analog circuits
Proceedings of the conference on Design, automation and test in Europe
An approach to realistic fault prediction and layout design for testability in analog circuits
Proceedings of the conference on Design, automation and test in Europe
Journal of Electronic Testing: Theory and Applications
Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems
Journal of Electronic Testing: Theory and Applications
Structural Fault Based Specification Reduction for Testing Analog Circuits
Journal of Electronic Testing: Theory and Applications
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems
ITC '98 Proceedings of the 1998 IEEE International Test Conference
DfT and on-line test of high-performance data converters: a practical case
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Defect-oriented testing of mixed-signal ICs: some industrial experience
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Exploit Analog IFA to Improve Specification Based Tests
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Compact structural test generation for analog macros
EDTC '97 Proceedings of the 1997 European conference on Design and Test
17.2 A Design for Testability Study on a High Performance Automatic Gain Control Circuit
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
7.1 Nonlinear Analog DC Fault Simulation by One-Step Relaxation
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Speed-up of High Accurate Analog Test Stimulus Optimization
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Subband Filtering Scheme for Analog and Mixed-Signal Circuit Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Multi-VDD Testing for Analog Circuits
Journal of Electronic Testing: Theory and Applications
TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault Simulation
Journal of Electronic Testing: Theory and Applications
Hard-Fault Detection and Diagnosis During the Application of Model-Based Data Converter Testing
Journal of Electronic Testing: Theory and Applications
Hierarchical parametric test metrics estimation: a ΣΔ converter BIST case study
ICCD'09 Proceedings of the 2009 IEEE international conference on Computer design
Built-in loopback test for IC RF transceivers
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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