Industrial Relevance of Analog IFA: A Fact or a Fiction
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Extending Fault-Based Testing to Microelectromechanical Systems
ETW '99 Proceedings of the 1999 IEEE European Test Workshop
Fundamentals of Heat and Mass Transfer
Fundamentals of Heat and Mass Transfer
Design automation for microfluidics-based biochips
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems
Journal of Electronic Testing: Theory and Applications
Concurrent testing of digital microfluidics-based biochips
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Multiple fault diagnosis in digital microfluidic biochips
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Built-in-self-test techniques for MEMS
Microelectronics Journal
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
Journal of Electronic Testing: Theory and Applications
Efficient parallel testing and diagnosis of digital microfluidic biochips
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Fault co-simulation for test evaluation of heterogeneous integrated biological systems
Microelectronics Journal
Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic Gates
Journal of Electronic Testing: Theory and Applications
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Developments in electronic/fluidic microsystems are progressing rapidly. The ultimate goal is to deliver products in the 10,000 fluidic reaction-wells range. Exciting applications include massive parallel DNA analysis and automatic drug synthesis. Until now, only functional testing has been used to “guarantee” the quality of micro-fluidic systems after manufacturing.In this paper, defect-oriented test approaches developed in analogue fault modeling and simulation have been used to predict for the first time the faulty behavior of micro-electronic fluidic microsystems. The modeling is targeted for use in complex electronic/fluidic microsystems employing commercial microsystem CAD tools. It enables a measure for the quality of these systems based on the performed (functional) tests and can be a guide for future test-stimuli generation and yield prediction.