Fault Modeling and Fault Simulation in Mixed Micro-Fluidic Microelectronic Systems
Journal of Electronic Testing: Theory and Applications
Testable Design and Testing of Micro-Electro-Fluidic Arrays
VTS '03 Proceedings of the 21st IEEE VLSI Test Symposium
Design, Testing, and Applications of Digital Microfluidics-Based Biochips
VLSID '05 Proceedings of the 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design
Design of Fault-Tolerant and Dynamically-Reconfigurable Microfluidic Biochips
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems
DELTA '06 Proceedings of the Third IEEE International Workshop on Electronic Design, Test and Applications
Architectural-level synthesis of digital microfluidics-based biochips
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Concurrent Testing of Droplet-Based Microfluidic Systems for Multiplexed Biomedical Assays
ITC '04 Proceedings of the International Test Conference on International Test Conference
Testing Microelectronic Biofluidic Systems
IEEE Design & Test
Assessment of Microfluidic System Testability using Fault Simulation and Test Metrics
Journal of Electronic Testing: Theory and Applications
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Heterogeneous integrated systems, combining, e.g. optical, magnetic, chemical devices and microelectronics, are becoming increasingly a matter of interest. Unfortunately, current system engineers lack the design and test tools to develop these emerging systems and guarantee a certain quality level. Furthermore, if these systems are used in a biological environment, bio-specific time-dependent faults can occur. An example is jamming of fluidic channels due to living, growing biological material. This paper will show fluidic modelling of our devices in VHDL-AMS, and apply it to system fault co-simulation obtained with regard to a new heterogeneous integrated device. It will aid the designer to investigate the influences of faults in the electrical and fluidic domain and take subsequent action, e.g. by adding design-for-test (DfT) observation hardware.