Fault Simulation for Analog Circuits Under Parameter Variations
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Parametric and Catastrophic Fault Coverage of Analog Circuits in Oscillation-Test Methodology
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
A Bayesian Approach to Reliability Prediction and Assessment of Component Based Systems
ISSRE '01 Proceedings of the 12th International Symposium on Software Reliability Engineering
Fault Modelling and Co-Simulation in FlowFET-Based Biological Array Systems
DELTA '06 Proceedings of the Third IEEE International Workshop on Electronic Design, Test and Applications
Journal of Electronic Testing: Theory and Applications
Testing Microelectronic Biofluidic Systems
IEEE Design & Test
Fault modelling and test development for continuous flow microchemical sensor systems
IMS3TW '08 Proceedings of the 2008 IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop
Fault co-simulation for test evaluation of heterogeneous integrated biological systems
Microelectronics Journal
Evaluation of analog/RF test measurements at the design stage
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Microfluidic circuits and systems
IEEE Circuits and Systems Magazine
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper we introduce a Microfluidic Fault Simulator, MFS, which uses a novel method of fault modeling and injection, the Fault Block, a generic and low abstraction fault modeling technique. This technique has been utilized over a wide range of fault conditions, in this paper we present a trapped bubble condition. In conjunction with injecting fault conditions, we can apply test methods. Two methods proving sensitive to microfluidic faults are; impedance spectroscopy and Levich electro-chemical sensors, illustrated here by a diffusional "Y" channel mixing system case study. Data from the MFS is analyzed using a Neyman-Pearson probabilistic approach, providing information on each sensor's test capability. Overall fault coverage for a given test is determined. This approach allows the analysis of fault coverage offered by functional-test orientated sensors to be compared to alternative approaches, which potentially offer increased coverage at lower cost.