Design automation for microfluidics-based biochips
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems
Journal of Electronic Testing: Theory and Applications
Concurrent testing of digital microfluidics-based biochips
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Multiple fault diagnosis in digital microfluidic biochips
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Testing Microelectronic Biofluidic Systems
IEEE Design & Test
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
Journal of Electronic Testing: Theory and Applications
Efficient parallel testing and diagnosis of digital microfluidic biochips
ACM Journal on Emerging Technologies in Computing Systems (JETC)
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Fault co-simulation for test evaluation of heterogeneous integrated biological systems
Microelectronics Journal
On-line testing of lab-on-chip using reconfigurable digital-microfluidic compactors
International Journal of Parallel Programming
Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic Gates
Journal of Electronic Testing: Theory and Applications
Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems
Journal of Electronic Testing: Theory and Applications
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Localized delay defects, like resistive shorts, resistiveopens, etc., can be effectively detected by testing the longesttestable path through each wire (or gate) in the circuit. Sucha delay test set is referred to as a longest-path-per-wire testset. ...