Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips

Authors:
Fei Su;William Hwang;Arindam Mukherjee;Krishnendu Chakrabarty
Affiliations:
Intel Corporation, Folsom, USA;St John's College, University of Oxford, Oxford;Department of Electrical and Computer Engineering, University of North Carolina at Charlotte, Charlotte, USA 28223;Department of Electrical and Computer Engineering, Duke University, Durham, USA 27708
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2007

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Abstract

Microfluidics-based biochips are soon expected to revolutionize biosensing, clinical diagnostics and drug discovery. Robust off-line and on-line test techniques are required to ensure system dependability as these biochips are deployed for safety-critical applications. Due to the underlying mixed-technology and mixed-energy domains, biochips exhibit unique failure mechanisms and defects. We first relate some realistic defects to fault models and observable errors. We next set up an experiment to evaluate the manifestations of electrode-short faults. Motivated by the experimental results, we present a testing and diagnosis methodology to detect catastrophic faults and locate faulty regions. The proposed method is evaluated using a biochip performing real-life multiplexed bioassays.