Extending Fault-Based Testing to Microelectromechanical Systems
Journal of Electronic Testing: Theory and Applications - special issue on the European test workshop 1999
Test and Testability of a Monolithic MEMS for Magnetic Field Sensing
Journal of Electronic Testing: Theory and Applications
Generation of Electrically Induced Stimuli for MEMS Self-Test
Journal of Electronic Testing: Theory and Applications
On the Integration of Design and Test for Chips Embedding MEMS
IEEE Design & Test
MEMS fault model generation using CARAMEL
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Failure mechanisms and fault classes for CMOS-compatible microelectromechanical systems
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Fault modeling of suspended thermal MEMS
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Design automation for microfluidics-based biochips
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems
Journal of Electronic Testing: Theory and Applications
Concurrent testing of digital microfluidics-based biochips
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Multiple fault diagnosis in digital microfluidic biochips
ACM Journal on Emerging Technologies in Computing Systems (JETC)
Built-in-self-test techniques for MEMS
Microelectronics Journal
Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips
Journal of Electronic Testing: Theory and Applications
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Testing of Low-cost Digital Microfluidic Biochips with Non-Regular Array Layouts
Journal of Electronic Testing: Theory and Applications
Electrical calibration of spring-mass MEMS capacitive accelerometers
Proceedings of the Conference on Design, Automation and Test in Europe
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