Digital signal processing in VLSI
Digital signal processing in VLSI
Wavelets and subband coding
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Industrial Relevance of Analog IFA: A Fact or a Fiction
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Analog and Mixed-Signal Benchmark Circuits-First Release
Proceedings of the IEEE International Test Conference
Proceedings of the IEEE International Test Conference
Dynamic Testing of ADCs Using Wavelet Transforms
Proceedings of the IEEE International Test Conference
A BIST Scheme for an SNR Test of a Sigma-Delta ADC
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
On-chip analog output response compaction
EDTC '97 Proceedings of the 1997 European conference on Design and Test
7.3 Effect of Noise on Analog Circuit Testing
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Application of joint time-frequency analysis in mixed signal testing
ITC'94 Proceedings of the 1994 international conference on Test
Pseudorandom testing for mixed-signal circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Signature analysis for analog and mixed-signal circuit test response compaction
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A parametric test method for analog components in integrated mixed-signal circuits
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
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A new technique is proposed to analyze and compress theoutput responses from analog circuits. We first describe thesubband filtering scheme to decompose responses from theanalog circuit under test (CUT). A subband filter or wavelettakes the response, then generates the decomposed signalsfor each frequency band. The decomposed signal for eachfrequency band is fed into its respective integrator. Twokinds of wavelets are used to decompose the test responseand effectively detect the faults in the circuit. Implementationissues including hardware overhead are also discussed.