DATE '99 Proceedings of the conference on Design, automation and test in Europe
Test Solution For OTA Based Analog Circuits
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Subband Filtering Scheme for Analog and Mixed-Signal Circuit Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
LFSR-based BIST for analog circuits using slope detection
Proceedings of the 14th ACM Great Lakes symposium on VLSI
How to reduce aliasing in linear analog testing
Proceedings of the 14th ACM Great Lakes symposium on VLSI
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry
Proceedings of the conference on Design, automation and test in Europe
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
Journal of Electronic Testing: Theory and Applications
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While the design of signature analyzers for digital circuits has been well researched in the past, signature analyzers for analog signals are relatively unknown. The primary difficulty in analyzing signatures for analog signals is that the latter are imprecise in nature. Therefore, deterministic signature analysis schemes, such as those based on finite-field arithmetic using linear feedback shift registers, are unsuitable for analog circuits. In this paper, a novel signature analysis scheme for analog and mixed signal circuits is proposed. The signatures possess the interesting property that if the input analog signal is imprecise within certain bounds (an inherent property of analog signals), then the generated signature is also imprecise within certain bounds. A failure is indicated by the generated signature being different from the expected signature by a margin greater than a predetermined threshold; the larger the effects of the failure, the larger the difference between the generated signature and the expected signature. The probabilities of aliasing and false rejection are also derived. Results for an example filter circuit are presented