Test Solution For OTA Based Analog Circuits

Authors:
Baidya N. ath Ray;P. Pal Chaudhuri;P. K. Nandi
Affiliations:
Electronics and Tele-Communication Engineering Department;Computer Science and Technology Department, Bengal Engineering College ( Deemed University), Howrah 711103, INDIA;Computer Science and Technology Department, Bengal Engineering College ( Deemed University), Howrah 711103, INDIA
Venue:
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
Year:
2002

Citing 6
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Abstract

This paper reports a comprehensive solution for the problem of test and diagnosis of OTA based analog circuits. Based on the parametric deviation of circuit components, a test and diagnosis methodology is proposed. Compressed signature generated out of multiple performance parameters has resulted in significant enhancement in fault diagnosing capability. The voluminous response data has been handled with Cellular Automata (CA) based classifier to achieve excellent diagnostic resolution.