Analysis and Design of Analog Integrated Circuits
Analysis and Design of Analog Integrated Circuits
A Simplified Polynomial-Fitting Algorithm for DAC and ADC BIST
Proceedings of the IEEE International Test Conference
A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits
ATS '04 Proceedings of the 13th Asian Test Symposium
An On-Chip Spectrum Analyzer for Analog Built-In Testing
Journal of Electronic Testing: Theory and Applications
Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters
ITC '04 Proceedings of the International Test Conference on International Test Conference
Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation
ITC '04 Proceedings of the International Test Conference on International Test Conference
Efficient loop-back testing of on-chip ADCs and DACs
ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
VTS '06 Proceedings of the 24th IEEE VLSI Test Symposium
A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters
Journal of Electronic Testing: Theory and Applications
Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Parallel Loopback Test of Mixed-Signal Circuits
VTS '08 Proceedings of the 26th IEEE VLSI Test Symposium
Design of Analog CMOS Integrated Circuits
Design of Analog CMOS Integrated Circuits
Testing analog and mixed-signal integrated circuits using oscillation-test method
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Signature analysis for analog and mixed-signal circuit test response compaction
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Journal of Electronic Testing: Theory and Applications
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A traditional specification-based core-level test method is no longer attractive in testing deeply embedded analog and mixed-signal circuits due to limited accessibility and resource issues. In order to overcome such difficulties, loopback testing has been considered as a promising solution when circuits include data conversion units; however its widespread adoption has been hindered due to fault masking, which may cause serious yield loss and test escape. The combination of seriously degraded components in a signal path and overqualified components in another signal path, may result in the overall performance of the loopback path being completely fault-free. This paper presents an efficient loopback test methodology which provides test accuracy equivalent to a traditional specification-based test. In our approach, a traditional loopback scheme is re-configured with an analog filter and an adder implemented on a Device Interface Board (DIB), and a multiple tone input is applied to the DUTs. The outcome of the proposed test is a set of performance parameters, allowing the evaluation of DUTs with respect to its specification, and efficient guidance of a self-repair mechanism. The mathematical analysis for the fault masking problem, based on linearity and noise parameters, is provided. In addition, various design parameters which may impact the accuracy of the proposed method are investigated. Both simulation and hardware measurements are presented to validate the proposed technique.