Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications

Authors:
Byoungho Kim;Zhenhai Fu;Jacob A. Abraham
Affiliations:
The University of Texas at Austin, USA;National Semiconductor Corporation, USA;The University of Texas at Austin, USA
Venue:
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Year:
2007

Citing 0
Cited 3

Calibration and Test Time Reduction Techniques for Digitally-Calibrated Designs: an ADC Case Study

Journal of Electronic Testing: Theory and Applications
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits

Journal of Electronic Testing: Theory and Applications
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model

Journal of Electronic Testing: Theory and Applications

Quantified Score

Hi-index	0.00

Visualization

Abstract

Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ...