Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
Journal of Electronic Testing: Theory and Applications
Proceedings of the Conference on Design, Automation and Test in Europe
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model
Journal of Electronic Testing: Theory and Applications
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Path delay fault simulation performance on multi-cycle delay paths common in industrial designs is discussed using paths from a large block in a microprocessor and a functional test vector suite. We profile fault simulation performance using a novel ...