Verifying functional specifications by regression techniques on Lissajous test signatures
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits
Journal of Electronic Testing: Theory and Applications
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Signatures used in low-cost schemes for testing analog and mixed-signal circuits do not directly represent or characterize the behavior of the device-under-test (DUT), since the lossy compression or complicated mathematical relations used can result in the loss of physical performance information. We develop a novel scheme where the signature is generated by built-in circuits based on a Ternary Signal Representation (TSR), which represents the behavior of a signal with three levels, positive, zero, and negative. The signatures can be used directly to characterize DUTs or can be manipulated to obtain widely accepted dynamic performance parameters, such as SNR, THD, etc. Simulation results on a \Delta \sum DAC and a \Delta \sum ADC using TSR signatures through built-in circuits are presented to show the feasibility of the proposed method.