Automatic test vector generation for mixed-signal circuits

Authors:
B. Ayari;N. Ben Hamida;B. Kaminska
Affiliations:
Ecole Polytechnique of the University of Montreal, P.O. Box 6079, Station "Centre-ville", Montreal, PQ, Canada, H3C 3A7;Ecole Polytechnique of the University of Montreal, P.O. Box 6079, Station "Centre-ville", Montreal, PQ, Canada, H3C 3A7;Ecole Polytechnique of the University of Montreal, P.O. Box 6079, Station "Centre-ville", Montreal, PQ, Canada, H3C 3A7
Venue:
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Year:
1995

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Abstract

Mixed circuit testing is known to be a very difficult task. This is due to the difficulty of: testing the analog part of the circuit, controlling the digital signal from the analog outputs, observing the analog outputs in the digital circuit, controlling the analog circuit from the digital outputs and observing the digital signals in the analog circuit. As a solution to these problems, we propose an automatic test vector generation for mixed circuits to perform functional testing. In this paper, a case of an analog block followed by a digital block is considered. The experimental results (simulation and discrete realization) show the efficiency of the automatic test generation technique.