ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Modern Control Systems
Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
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Analogue circuits are sensitive to parameter fluctuations. Such sensitivity may cause an analogue circuit to have low operating performance. In this paper, an estimation method of parameter fluctuations that integrates design and test is proposed. It is based on analytical modelling equations to estimate the sensitivity of analogue circuits to parameter fluctuations as well as the uncertainty bound for robust operation, independent of simulation.