ABILBO: Analog BuILt-in Block Observer
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Reuse of existing resources for analog BIST of a switch capacitor filter.
DATE '00 Proceedings of the conference on Design, automation and test in Europe
The ΣΔ-BIST Method Applied to Analog Filters
Journal of Electronic Testing: Theory and Applications
Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components
EDTC '96 Proceedings of the 1996 European conference on Design and Test
A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources
Journal of Electronic Testing: Theory and Applications
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Abstract: In this paper we propose a configuration for a VLSI analog sine wave generator with an appropriate frequency BIST. The generator is used for testing circuits that require sinusoidal input signals with a variable frequency as an input stimulus. The detectors indicate any deviation of the frequency input signal from the nominal value /spl plusmn//spl epsiv/. A sine wave generator and two different BISTs are proposed: the defection and translation (DandT) T-BIST approach and the frequency-counter BIST approach. Some experimental results are also presented.